Single pixel characterization of X-ray TES microcalorimeter under AC bias at MHz frequencies
Year of publication
2013
Authors
Akamatsu, H.; Gottardi, L.; Adams, J.; Bailey, C.; Bandler, S.; Bruijn, M.; Chervenak, J.; Eckart, M.; Finkbeiner, F.; Den Hartog, R.; Hoevers, H.; Kelley, R.; van Der Kuur, J.; Van Den Linden, T.; Lindeman, M.; Porter, F.; Sadleir, J.; Smith, S.; Beyer, J.; Kiviranta, Mikko
Show moreOrganizations and authors
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Volume
23
Issue
3
Article number
2100503
ISSN
Publication forum
Publication forum level
1
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Fields of science
Electronic, automation and communications engineering, electronics
Keywords
[object Object],[object Object],[object Object],[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
DOI
10.1109/TASC.2012.2235509
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes