The IEEE Reliability Test System: A Proposed 2019 Update

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The IEEE Reliability Test System: A Proposed 2019 Update

Year of publication

2020

Authors

Barrows, Clayton; Preston, Eugene; Staid, Andrea; Stephen, Gord; Watson, Jean Paul; Bloom, Aaron; Ehlen, Ali; Ikaheimo, Jussi; Jorgenson, Jennie; Krishnamurthy, Dheepak; Lau, Jessica; McBennett, Brendan; O'Connell, Matthew

Publication type

Publication format

Article

Parent publication type

Journal

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1

Publication channel information

Parent publication name

Parent publication editors

Conference

Publisher

Volume

35

Issue

1

Pages

119-127

ISBN

​Publication forum

57572

​Publication forum level

2

Other information

Fields of science

Electronic, automation and communications engineering, electronics; Environmental engineering

Open access

No

Publication country

undefined

Language

English

International co-publication

true

Co-publication with a company

true

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]