Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors
Year of publication
2014
Authors
Blasco, J.; Castan, H.; Garcia, H.; Duenas, S.; Sune, J.; Kemell, M.; Kukli, K.; Ritala, M.; Leskelä, M.; Miranda, E.
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Journal/Series
Parent publication name
Conference
European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
Volume
54
Issue
9-10
Pages
1707-1711
ISSN
Publication forum
Publication forum level
1
Open access
Open access in the publisher’s service
No information
Self-archived
Unknown
Other information
Fields of science
Physical sciences; Chemical sciences
Identified topic
[object Object]
Publication country
Germany
Internationality of the publisher
International
Language
English
International co-publication
Yes
Co-publication with a company
Unknown
DOI
10.1016/j.microrel.2014.07.067
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes