Application of a bandwidth correction method to thin-film reflectance measurements

Year of publication

2026

Authors

Danilenko, Aleksandr; Rastgou, Masoud; Manoocheri, Farshid; Ikonen, Erkki

Organizations and authors

University of Eastern Finland

Danilenko Aleksandr

Aalto University

Ikonen Erkki

Manoocheri Farshid

Rastgou Masoud

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Metrologia

Volume

Issue

Article number

015007

ISSN

0026-1394

Publication forum

63305

Publication forum level

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Partially open publication channel

License of the publisher’s version

CC BY

Self-archived

Yes

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics

Identified topic

[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Co-publication with a company

DOI

10.1088/1681-7575/ae3e94

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes