Preface: Proceedings of Second International Conference on Advances in System Testing and Validation Lifecycle (VALID) 2010
Year of publication
2010
Authors
Alimohammad, A.; Baruzzo, A.; Du Bousquet, L.; Dini, P.; Muccini, H.; Klaus, A.; Perälä, Juho; Pandini, D.; Senguttuvan, R.; Sinha, A.; Stefanescu, A.; Vermeulen, B.; Van Baelen, S.; Gross, H.-G.
Organizations and authors
VTT Technical Research Centre of Finland Ltd
Perälä Juho
Publication type
Publication format
Article
Parent publication type
Compendium
Article type
Other article
Audience
ScientificPeer-reviewed
Non Peer-ReviewedMINEDU's publication type classification code
B2 Book sectionPublication channel information
Parent publication name
Conference
2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010
Publisher
IEEE Institute of Electrical and Electronic Engineers
Pages
viii-ix
ISBN
Open access
Open access in the publisher’s service
Yes
Self-archived
No
Other information
Language
English
International co-publication
No
Co-publication with a company
No
DOI
10.1109/VALID.2010.4
The publication is included in the Ministry of Education and Culture’s Publication data collection
No