NPL Surface Sample preview

Description

Sample manufactured by National Physical Laboratory by additive manufacturing. The goal of the sample and the measurements was to study the ability of the XCT instrument in measuring surface roughness. Studies were part of the AdvanCT project at VTT MIKES. Preview of PAS-dataset doi:10.23729/df883f74-ab5d-438a-94e2-a3f66f3d63c5
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Year of publication

2021

Type of data

Authors

Jukka Kuva Orcid -palvelun logo - Publisher, Creator

Project

Other information

Fields of science

Physical sciences

Language

Open access

Open

License

Creative Commons Attribution 4.0 International (CC BY 4.0)

Keywords

tomography, metrology, surface roughness

Subject headings

Temporal coverage

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