A standard jimaRT tool used to check resolution of x-ray instruments. The sample was measured with XCT so that we could safely remove excess material around the sample (using the information about the structure of the sample holder that we get using XCT) before AFM measurements. Preview of PAS-dataset https://doi.org/10.23729/83bc68a4-977c-4de9-a78d-0a9dfef7d8ee

2022