A project headed by Dr. Mikko Laitinen and funded by Academy of Finland will develop new tools and calculation methods for the materials analysis needs. Thin film industry of today requires detailed elemental data of the grown films, which in some cases are thinner than a single atomic layer. The ToF-ERDA method which is used to characterize such films in academia and in industry will be develop further with the help of more precise analysis tools and faster detector systems. New type calculation functions and faster energy detector for the low energy heavy ions will result from this 5-year project. Also, analysis software called Potku, a “kick” in Finnish, is further developed to analyze recoiled and scattered heavy ions, detected by the new detector. All of these three parallel running development projects will be combined as a more accurate and detailed results of the thin film elemental compositions – which are required both by the industry and academia.

2020

2025