Synchronized thermography for multi-layer thin film characterization
Year of publication
2014
Authors
Leppänen, Kimmo; Saarela, Juha; Fabritius, Tapio
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Non Peer-ReviewedMINEDU's publication type classification code
B3 Article in conference proceedings (non-peer-reviewed)Publication channel information
Journal
Proceedings of SPIE : the International Society for Optical Engineering
Parent publication name
Parent publication editors
Eldada, L.A. ; Heben, M.J.
Conference
Spie conference proceedings
Publisher
SPIE
Issue
9177
Article number
917705
ISSN
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Fields of science
Electronic, automation and communications engineering, electronics; Materials engineering
Keywords
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Publication country
United States
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
Unknown
DOI
10.1117/12.2060804
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes