Synchronized thermography for multi-layer thin film characterization
Year of publication
2014
Authors
Leppänen, Kimmo; Saarela, Juha; Fabritius, Tapio
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Non Peer-ReviewedMINEDU's publication type classification code
B3 Article in conference proceedings (non-peer-reviewed)Publication channel information
Journal/Series
Proceedings of SPIE : the International Society for Optical Engineering
Parent publication name
Conference
Spie conference proceedings
Publisher
SPIE
Issue
9177
Article number
917705
ISSN
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Fields of science
Electronic, automation and communications engineering, electronics; Materials engineering
Keywords
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Publication country
United States
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
Unknown
DOI
10.1117/12.2060804
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes