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Synchronized thermography for multi-layer thin film characterization

Year of publication

2014

Authors

Leppänen, Kimmo; Saarela, Juha; Fabritius, Tapio

Organizations and authors

University of Oulu

Saarela Juha Mikko Sakari

Leppänen Kimmo Kalervo

Fabritius Tapio Orcid -palvelun logo

Publication type

Publication format

Article

Parent publication type

Conference

Article type

Other article

Audience

Scientific

Peer-reviewed

Non Peer-Reviewed

MINEDU's publication type classification code

B3 Article in conference proceedings (non-peer-reviewed)

Publication channel information

Journal

Proceedings of SPIE : the International Society for Optical Engineering

Parent publication editors

Eldada, L.A. ; Heben, M.J.

Conference

Spie conference proceedings

Publisher

SPIE

Issue

9177

Article number

917705

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Electronic, automation and communications engineering, electronics; Materials engineering

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

Unknown

DOI

10.1117/12.2060804

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes