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Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy

Year of publication

2012

Authors

Kivioja, Antti O.; Jääskeläinen, Anna-Stiina; Ahtee, Ville; Vuorinen, Tapani

Organizations and authors

Aalto University

Vuorinen Tapani Orcid -palvelun logo

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Volume

61

Issue

1

Pages

1-9

​Publication forum

69045

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Chemical engineering; Materials engineering

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1016/j.vibspec.2012.02.014

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes