Towards a tomographic index of systemic risk measures
Year of publication
2015
Authors
Björk, Kaj Mikael; Kouontchou, Patrick; Lendasse, Amaury; Miche, Yoan; Maillet, Bertrand
Organizations and authors
Aalto University
Miche Yoan
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
European symposium on artificial neural networks, computational intelligence and machine learning
Publisher
ESANN
Pages
543-548
ISBN
Open access
Open access in the publisher’s service
Yes
Open access of publication channel
Fully open publication channel
Self-archived
No
Other information
Fields of science
Computer and information sciences
Keywords
[object Object]
Publication country
Belgium
Internationality of the publisher
International
Language
English
International co-publication
Yes
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes