undefined

< Back to search results

Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

Year of publication

2017

Authors

Seppa, Jeremias; Reischl, Bernhard; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Raiteri, Paolo; Rohl, Andrew L.; Nordlund, Kai; Lassila, Antti

Organizations and authors

University of Helsinki

Reischl Bernhard

Nordlund Kai

VTT Technical Research Centre of Finland Ltd

Lassila Antti Orcid -palvelun logo

Sairanen Hannu

Seppä Jeremias Orcid -palvelun logo

Heinonen Martti

Korpelainen Virpi Orcid -palvelun logo

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal

Measurement science and technology

Parent publication name

Measurement Science and Technology

Volume

28

Issue

3

Article number

034004

ISSN

0957-0233

​Publication forum

63079

​Publication forum level

2

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Mathematics; Physical sciences; Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Publication country

United Kingdom

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1088/1361-6501/28/3/034004

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes