Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers

Year of publication

2018

Authors

Kupsc, Pawel; Javanainen, Arto; Ferlet-Cavrois, Véronique; Muschitiello, Michele; Barnes, Andrew; Zadeh, Ali; Calcutt, Jordan; Poivey, Christian; Stieglauer, Hermann; Voss, Kay-Obbe

Organizations and authors

University of Jyväskylä

Javanainen Arto

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

IEEE Transactions on Nuclear Science

Publisher

Institute of Electrical and Electronics Engineers

Volume

Issue

Pages

732-738

ISSN

0018-9499

Publication forum

57566

Publication forum level

Open access

Open access in the publisher’s service

Self-archived

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object]

Identified topic

[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1109/TNS.2018.2791564

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes