Towards a holistic architecture for a SIP Test framework
Year of publication
2014
Authors
Kanstrén, Teemu; Aho, Pekka
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
6th International Conference on Advances in System Testing and Validation Lifecycle, VALID 2014
Publisher
International Academy, Research, and Industry Association IARIA
Pages
46-53
ISBN
Open access
Open access in the publisher’s service
Yes
Self-archived
No
Other information
Fields of science
Electronic, automation and communications engineering, electronics
Keywords
[object Object],[object Object],[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes