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Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

Year of publication

2010

Authors

Sintonen, Sakari; Suihkonen, Sami; Svensk, Olli; Törmä, Pekka Tuomas; Ali, Muhammad; Sopanen, Markku; Lipsanen, Harri

Organizations and authors

Aalto University

Lipsanen Harri Orcid -palvelun logo

Sopanen Markku Orcid -palvelun logo

Ali Muhammad

Svensk Olli

Törmä Pekka

Sintonen Sakari

Suihkonen Sami

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Publisher

Wiley

Volume

7

Issue

7-8

Pages

1790-1793

​Publication forum

65012

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Physical sciences; Chemical sciences; Electronic, automation and communications engineering, electronics; Materials engineering; Nanotechnology; Medical biotechnology

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1002/pssc.200983630

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes