undefined

< Back to search results

The Effect of Oxygenation on the Radiation Hardness of Silicon Studied by Surface Photovoltage Method

Year of publication

2002

Authors

Yli-Koski, Marko; Härkönen, Jaakko; Tuominen, Eija; Lassila-Perini, Kati; Mehtälä, P.; Nummela, Saara; Nysten, J.; Heikkilä, Paula; Ovchinnikov, Victor; Palokangas, Martti; Palmu, Leena; Kallijärvi, S.; Alanko, Tommi; Laitinen, Pauli; Pirojenko, A; Riihimäki, I.; Tiourine, G.; Virtanen, Ari
Show more

Organizations and authors

Aalto University

Yli-Koski Marko Orcid -palvelun logo

Ovchinnikov Victor

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal

IEEE Transactions on Nuclear Science

Publisher

IEEE

Volume

49

Issue

6

Pages

2910-2913

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Keywords

[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes