AFM tip characterization by Kelvin probe force microscopy

Year of publication

2010

Authors

Barth, C.; Hynninen, T.; Bieletzki, M.; Henry, C.R.; Foster, A.S.; Esch, F.; Heiz, U.

Organizations and authors

Aalto University

Foster Adam

Hynninen Teemu

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

New Journal of Physics

Publisher

Institute of Physics Publishing

Volume

Issue

September 2010

Article number

093024

Pages

1-14

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Fully open publication channel

Self-archived

Yes

Other information

Fields of science

Physical sciences; Mechanical engineering; Environmental engineering; Nanotechnology

Keywords

[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

DOI

10.1088/1367-2630/12/9/093024

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes