Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas

Year of publication

2009

Authors

Ranvier, Sylvain; Kyrö, Mikko; Icheln, Clemens; Luxey, Cyril; Staraj, Robert; Vainikainen, Pertti

Organizations and authors

Aalto University

Icheln Clemens

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Microwave and Optical Technology Letters

Publisher

Wiley

Volume

Issue

Pages

319-324

ISSN

0895-2477

Publication forum

63350

Publication forum level

Open access

Open access in the publisher’s service

Self-archived

Other information

Fields of science

Physical sciences; Astronomy and space science; Electronic, automation and communications engineering, electronics; Materials engineering; Nanotechnology; Geosciences

Keywords

[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Co-publication with a company

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes