Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO<sub>2</sub> (110) surface

Year of publication

2008

Authors

Enevoldsen, Georg H.; Pinto, Henry P.; Foster, Adam S.; Jensen, Mona C.R.; Kühnle, Angelika; Reichling, Michael; Hofer, Werner A.; Lauritsen, Jeppe V.; Besenbacher, Flemming

Organizations and authors

Aalto University

Foster Adam

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Physical Review B

Publisher

American Physical Society

Volume

Issue

Article number

045416

Pages

1-19

ISSN

1098-0121

Publication forum

65024

Publication forum level

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Fully open publication channel

Self-archived

Yes

Other information

Fields of science

Physical sciences; Mechanical engineering; Environmental engineering; Nanotechnology

Keywords

[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

DOI

10.1103/PhysRevB.78.045416

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes