White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Year of publication

2002

Authors

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knuuttila, L.; Riikonen, J.

Organizations and authors

Aalto University

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Materials Research Society Symposia Proceedings

Publisher

SPRINGER

Issue

693

Pages

pp. I3.27.1-I3.27.6

Open access

Open access in the publisher’s service

Self-archived

Other information

Keywords

[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Co-publication with a company

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes