Novel method for error limit determination in x-ray reflectivity analysis
Year of publication
2008
Authors
Tiilikainen, Jouni; Mattila, Marco; Hakkarainen, Teppo; Lipsanen, Harri
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal/Series
Publisher
Volume
41
Issue
11
Article number
115302
Pages
1-8
ISSN
Publication forum
Publication forum level
2
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Fields of science
Physical sciences; Chemical sciences; Electronic, automation and communications engineering, electronics; Materials engineering; Nanotechnology; Medical biotechnology
Keywords
[object Object],[object Object]
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
No
DOI
10.1088/0022-3727/41/11/115302
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes