Transimission electron energy-loss spectroscopy measurements of the dielectric function of Si/SiO2 multilayers
Year of publication
1998
Authors
Keränen, J.; Lepistö, T.; Ryen, L.; Novikov, S.V.; Olsson, E.
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal/Series
Journal of Applied Physics
Publisher
American Institute of Physics
Volume
84
Issue
12
Pages
6827-6831
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Keywords
[object Object]
Identified topic
[object Object]
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes