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Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines

Year of publication

2016

Authors

Llovet, Xavier; Pinard, Philippe T.; Heikinheimo, Erkki; Louhenkilpi, Seppo; Richter, Silvia

Organizations and authors

Aalto University

Louhenkilpi Seppo

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Microscopy and Microanalysis

Publisher

Oxford University Press

Volume

22

Issue

6

Pages

1233-1243

ISSN

1431-9276

​Publication forum

63345

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Materials engineering

Keywords

[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

No

DOI

10.1017/S1431927616011831

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes