Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers
Year of publication
2000
Authors
Rantamäki, R.; Tuomi, T.; Zytkiewicz, Z.R.; McNally, P.J.; Danilewsky, A.N.
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal
Journal of X-Ray Science and Technology
Publisher
IOS PRESS
Volume
8
Issue
4
Pages
277-288
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Keywords
[object Object],[object Object],[object Object]
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes