Modeling the effect of mobile ion contamination on the stability of a microelectromechanical resonator
Year of publication
2011
Authors
Haarahiltunen, Antti; Varpula, Aapo; Savin, Hele
Organizations and authors
Aalto University
Savin Hele 
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal/Series
Publisher
Volume
110
Issue
4
ISSN
Publication forum
Publication forum level
2
Open access
Open access in the publisher’s service
Yes
Open access of publication channel
Fully open publication channel
Self-archived
Yes
Other information
Fields of science
Physical sciences; Chemical sciences; Electronic, automation and communications engineering, electronics; Materials engineering; Nanotechnology; Medical biotechnology
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
No
DOI
10.1063/1.3622511
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes