Extended Defects in Silicon Carbide Single Crystal Material
Year of publication
2002
Authors
Yakimova, R.; Jacobson, H.; Vouroutzis, N.; Syväjärvi, M.; Stoemenos, J.; Tuomi, T.; Janzén, E.
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
International Conference Extended Defects in Semiconductors, Bologna, Italy, 1-6 June, 2002
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Keywords
[object Object],[object Object]
Internationality of the publisher
International
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes