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On-wafer noise parameter measurements at W-band

Year of publication

2003

Authors

Vähä-Heikkilä, Tauno; Lahdes, Manu; Kantanen, Mikko; Tuovinen, Jussi

Organizations and authors

VTT Technical Research Centre of Finland Ltd

Lahdes Manu

Kantanen Mikko Orcid -palvelun logo

Vähä-Heikkilä Tauno

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

IEEE Transactions on Microwave Theory and Techniques

Volume

51

Issue

6

Pages

1621-1628

ISSN

0018-9480

​Publication forum

57558

​Publication forum level

3

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Keywords

[object Object],[object Object],[object Object],[object Object]

Identified topic

[object Object]

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1109/TMTT.2003.812554

The publication is included in the Ministry of Education and Culture’s Publication data collection

No