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Characterisation and Control of Defects in Semiconductors

Year of publication

2019

Authors

Tuomisto, Filip

Organizations and authors

University of Helsinki

Tuomisto Filip

Publication type

Publication format

Editorial work

Parent publication type

Compilation

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

C2 Edited book, conference proceedings or special issue of a journal

Publication channel information

Publisher

Institution of engineering and technology

ISBN

978-1-78561-655-6

​Publication forum

5512

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics; Materials engineering

Keywords

[object Object],[object Object],[object Object]

Publication country

United Kingdom

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes