Modeling Field-effect in Black Silicon and its Impact on Device Performance

Year of publication

2020

Authors

Heinonen, Juha; Pasanen, Toni; Vähänissi, Ville; Juntunen, Mikko; Savin, Hele

Organizations and authors

Aalto University

Savin Hele

Heinonen Juha

Pasanen Toni

Vähänissi Ville

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

IEEE Transactions on Electron Devices

Publisher

IEEE

Volume

Issue

Article number

9027860

Pages

1645-1652

ISSN

0018-9383

Publication forum

57538

Publication forum level

Open access

Open access in the publisher’s service

Self-archived

Yes

Other information

Fields of science

Materials engineering

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Co-publication with a company

Yes

DOI

10.1109/TED.2020.2975145

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes