Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

Year of publication

2020

Authors

Xama, Nektar; Andraud, Martin; Gomez, Jhon; Esen, Baris; Dobbelaere, Wim; Vanhooren, Ronny; Coyette, Anthony; Gielen, Georges

Organizations and authors

Aalto University

Andraud Martin

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS

Publisher

ACM

Volume

Issue

Article number

ISSN

1084-4309

Publication forum

50137

Publication forum level

Open access

Open access in the publisher’s service

Self-archived

Yes

Other information

Fields of science

Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1145/3408063

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes