General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

< Back to search results

General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Year of publication

2021

Authors

Honkanen, Ari-Pekka; Huotari, Simo

Publication type

Publication format

Article

Parent publication type

Journal

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1

Publication channel information

Journal

IUCrJ.

Parent publication name

IUCrJ.

Parent publication editors

Conference

Publisher

Volume

8

Issue

1

Pages

102-115

ISBN

​Publication forum

87159

​Publication forum level

1

Other information

Fields of science

Physical sciences

Open access

Yes

Publication country

United Kingdom

Language

English

International co-publication

false

Co-publication with a company

false

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]