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Can hydrogenation mitigate Cu-induced bulk degradation in silicon?

Year of publication

2020

Authors

Heikkinen, Ismo T.S.; Wright, Brendan; Soeriyadi, Anastasia H.; Yli-Koski, Marko; Kim, Moonyong; Vähänissi, Ville; Hallam, Brett J.; Savin, Hele

Organizations and authors

Aalto University

Savin Hele Orcid -palvelun logo

Heikkinen Ismo Orcid -palvelun logo

Vähänissi Ville Orcid -palvelun logo

Yli-Koski Marko

Publication type

Publication format

Article

Parent publication type

Conference

Article type

Other article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A4 Article in conference proceedings

Publication channel information

Publisher

IEEE

Article number

9300619

Pages

2582-2585

​Publication forum

54011

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

Yes

Other information

Fields of science

Materials engineering

Keywords

[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

No

DOI

10.1109/PVSC45281.2020.9300619

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes