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Characterization and Identification of Defects in CdTe Detectors Using Scanning Laser Transient Current Technique

Year of publication

2021

Authors

Kalliokoski, Matti; Bharthuar, Shudhashil; Brücken, Erik; Golovleva, Maria; Gädda, Akiko; Kirschenmann, Stefanie; Ott, Jennifer

Organizations and authors

University of Helsinki

Gädda Akiko

Brücken Erik

Ott Jennifer

Golovleva Maria

Kalliokoski Matti

Bharthuar Shudhashil

Kirschenmann Stefanie

Publication type

Publication format

Article

Parent publication type

Conference

Article type

Other article

Audience

Scientific

Peer-reviewed

Non Peer-Reviewed

MINEDU's publication type classification code

B3 Article in conference proceedings (non-peer-reviewed)

Publication channel information

Parent publication name

2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

Conference

2020 Virtual IEEE Nuclear Science Symposium and Medical Imaging Conference

Publisher

IEEE

Pages

1-5

ISSN

1082-3654

ISBN

978-1-7281-7693-2

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Physical sciences

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

Yes

DOI

10.1109/NSS/MIC42677.2020.9507842

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes