Model and Quality Driven Embedded Systems Engineering
Year of publication
2009
Authors
Ovaska, Eila; Balogh, András; Campos, Sergio; Noguero, Adrian; Pataricza, András; Tiensyrjä, Kari; Vicedo, Josetxo
Abstract
The world of embedded systems is broad and diverse, addressing a wide variety of application domains. Although technologically, the situation for embedded systems is still quite fragmented, platform-based engineering, reference designs and maturing system domains have effected great changes. However, the features of modern embedded systems are changing at such a rate that it is increasingly difficult for companies to bring new products to the market within acceptable time scales and still guarantee acceptable levels of operational quality. This report aims for its part to increase the convergence of views with regard to embedded systems technologies and engineering methods. The objective of this report is to introduce the methodology framework for model and quality driven embedded systems engineering. The framework is composed of three key artefacts, which provide the basis for building specific methodology instances. While instantiating this methodology framework, it has to be adapted to the needs and constraints of that specific application domain and development organisation. The first key artefact of the methodology framework is the process model, the Y-chart model. The second key artefact is the Unified Modelling Language (UML) adapted to embedded systems engineering with a specific profile. The third key artefact consists of a set of evaluation methods that have been selected for use in embedded system engineering. Within the conclusions, an initial integrated development environment is introduced for embedded systems engineering. The methods selected for the methodology framework have been validated in different application domains of embedded or/and software systems engineering areas.
Show moreOrganizations and authors
VTT Technical Research Centre of Finland Ltd
Ovaska Eila
Publication type
Publication format
Monograph
Audience
Scientific
Peer-reviewed
Peer-Reviewed
MINEDU's publication type classification code
C1 Scientific bookPublication channel information
Journal/Series
Publisher
Issue
705
ISSN
ISBN
Publication forum
Open access
Open access in the publisher’s service
Yes
License of the publisher’s version
Other license
Self-archived
No
Other information
Keywords
[object Object],[object Object],[object Object],[object Object],[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No