New methods for the assessment of ESD threats to electronic components
Year of publication
2003
Authors
Paasi, Jaakko; Smallwood, Jeremy; Salmela, Hannu
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
25th Electrical Overstress/Electrostatic Discharge Symposium, EOS-25
Publisher
IEEE Institute of Electrical and Electronic Engineers
Pages
151-160
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Keywords
[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No