Wideband cryogenic on-wafer measurements at 20 - 295 K and 50-110 GHz
Year of publication
2003
Authors
Vähä-Heikkilä, Tauno; Varis, Jussi; Hakojärvi, Hannu; Tuovinen, Jussi
Organizations and authors
VTT Technical Research Centre of Finland Ltd
Hakojärvi Hannu
Tuovinen Jussi
Varis Jussi
Vähä-Heikkilä Tauno
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
33rd European Microwave Conference, EuMC 2003
Publisher
IEEE Institute of Electrical and Electronic Engineers
Pages
1167-1170
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Keywords
[object Object],[object Object],[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
DOI
10.1109/EUMA.2003.341147
The publication is included in the Ministry of Education and Culture’s Publication data collection
No