W-band on-wafer noise parameter measurements
Year of publication
2001
Authors
Vähä-Heikkilä, Tauno; Lahdes, Manu; Varis, Jussi; Kantanen, Mikko; Tuovinen, Jussi; Karttaavi, Timo; Hakojärvi, Hannu
Organizations and authors
VTT Technical Research Centre of Finland Ltd
Varis Jussi
Lahdes Manu
Kantanen Mikko 
Vähä-Heikkilä Tauno
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
31st European Microwave Conference, EuMC 2001
Publisher
CMP Europe Ltd
Pages
355-358
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Identified topic
[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No