On-wafer noise parameter measurements at 60 GHz
Year of publication
1997
Authors
Lahdes, Manu; Sipilä, Markku; Tuovinen, Jussi
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
IEEE Workshop on Experimentally based FET Device Modelling & Related Nonlinear Circuit Design
Publisher
IEEE Institute of Electrical and Electronic Engineers
Pages
13.1-13.6
Open access
Open access in the publisher’s service
Yes
Self-archived
No
Other information
Identified topic
[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No