Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy
Year of publication
1994
Authors
Likonen, Jari; Saarilahti, J.; Grönberg, Leif; Kiviranta, Mikko
Organizations and authors
VTT Technical Research Centre of Finland Ltd
Saarilahti J.
Likonen Jari
Grönberg Leif 
Kiviranta Mikko
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A4 Article in conference proceedingsPublication channel information
Parent publication name
Conference
Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX
Publisher
Wiley-Blackwell
Pages
531-534
ISBN
Open access
Open access in the publisher’s service
No
Self-archived
No
Other information
Fields of science
Computer and information sciences; Electronic, automation and communications engineering, electronics
Keywords
[object Object]
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No