Feasibility of using Charpy-size specimens in J-R curve testing
Year of publication
1988
Authors
Wallin, Kim; Saario, Timo
Organizations and authors
Publication type
Publication format
Article
Parent publication type
Conference
Article type
Other article
Audience
ScientificPeer-reviewed
Non Peer-ReviewedMINEDU's publication type classification code
B3 Article in conference proceedings (non-peer-reviewed)Publication channel information
Parent publication name
Primary Circuit Integrity Meeting: CSNI Principal Working Group No. 3
Pages
105-111
Open access
Open access in the publisher’s service
No information
Self-archived
No
Other information
Language
English
International co-publication
No
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No