Role of chemical disorder on radiation-induced defect production and damage evolution in NiFeCoCr
Year of publication
2022
Authors
Zhou, Yufan; Velisa, Gihan; San, Saro; Crespillo, Miguel L.; Fan, Zhe; Bei, Hongbin; Weber, William J.; Xiu, Pengyuan; Wang, Lumin; Tuomisto, Filip; Ching, Wai-Yim; Zhang, Yanwen
Organizations and authors
University of Helsinki
Tuomisto Filip
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal/Series
Parent publication name
Volume
565
Article number
153689
ISSN
Publication forum
Publication forum level
2
Open access
Open access in the publisher’s service
No
Open access of publication channel
Partially open publication channel
Self-archived
Yes
License of the self-archived publication
CC BY NC ND
Other information
Fields of science
Physical sciences
Keywords
[object Object],[object Object],[object Object],[object Object]
Publication country
Netherlands
Internationality of the publisher
International
Language
English
International co-publication
Yes
Co-publication with a company
No
DOI
10.1016/j.jnucmat.2022.153689
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes