Penetration of corrosive species into copper exposed to simulated O<sub>2</sub>-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)
Year of publication
2023
Authors
Yue, Xiaoqi; Malmberg, Per; Isotahdon, Elisa; Ratia-Hanby, Vilma; Huttunen-Saarivirta, Elina; Leygraf, Christofer; Pan, Jinshan
Abstract
ToF-SIMS analysis of copper samples after exposures to simulated groundwater with and without sulfide addition was performed to investigate the penetration of corrosive species containing H, S, O, and Cl, into copper. Depth profiles show extent of penetration and 2D/3D images reveal local elemental distribution of the corrosive species at different depths inside copper. Pre-oxidation did not reduce the penetration while sulfide additional in groundwater and exposure at 60 °C significantly promoted the penetration. The extent of penetration of the corrosive species into copper demonstrates the need for risk assessment of complex corrosion forms such as sulfide-induced embrittlement and cracking.
Show moreOrganizations and authors
VTT Technical Research Centre of Finland Ltd
Huttunen-Saarivirta Elina
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal
Volume
210
Issue
Part 2
Article number
110833
ISSN
Publication forum
Publication forum level
3
Open access
Open access in the publisher’s service
Yes
Open access of publication channel
Partially open publication channel
License of the publisher’s version
CC BY
Self-archived
No
Other information
Fields of science
Mechanical engineering; Materials engineering
Keywords
[object Object],[object Object],[object Object],[object Object],[object Object]
Language
English
International co-publication
Yes
Co-publication with a company
No
DOI
10.1016/j.corsci.2022.110833
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes