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Improving TTCN-3 test system robustness using software fault tolerance

Year of publication

2009

Authors

Perälä, Juho

Organizations and authors

VTT Technical Research Centre of Finland Ltd

Perälä Juho

Publication type

Publication format

Article

Parent publication type

Conference

Article type

Other article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A4 Article in conference proceedings

Publication channel information

Parent publication name

The First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)

Conference

The First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)

Publisher

IEEE Institute of Electrical and Electronic Engineers

Pages

48-56

ISBN

978-0-7695-3774-0

​Publication forum

5475

Open access

Open access in the publisher’s service

No

Self-archived

No

Other information

Fields of science

Computer and information sciences

Keywords

[object Object],[object Object],[object Object],[object Object]

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1109/VALID.2009.27

The publication is included in the Ministry of Education and Culture’s Publication data collection

No