Comparing novel small-angle x-ray scattering approaches for absolute size and number concentration measurements of spherical SiO<sub>2</sub> particles to established methods

Year of publication

2024

Authors

Schürmann, Robin; Gaál, Anikó; Sikora, Aneta; Ojeda, David; Bartczak, Dorota; Goenaga-Infante, Heidi; Korpelainen, Virpi; Sauvet, Bruno; Deumer, Jérôme; Varga, Zoltán; Gollwitzer, Christian

Organizations and authors

VTT Technical Research Centre of Finland Ltd

Sauvet Bruno

Korpelainen Virpi

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

Nanotechnology

Volume

Issue

Article number

385701

ISSN

0957-4484

Publication forum

63717

Publication forum level

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Partially open publication channel

Self-archived

Other information

Fields of science

Chemical engineering

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1088/1361-6528/ad568b

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes