(poster) Robustness of electrical quality of ion implanted black silicon emitters: Comparison between different ion implantation service providers
Year of publication
2024
Authors
Morozova, Olga; Chen, Kexun; Radfar, Behrad; Kentsch, Ulrich; Antwis, Luke; Savin, Hele; Vähänissi, Ville
Organizations and authors
Publication type
Publication format
Abstract
Parent publication type
Conference
Audience
Scientific
Publication channel information
Conference
Proceedings (EU PVSEC)
Open access
Open access in the publisher’s service
No
Self-archived
Yes
Other information
Fields of science
Materials engineering
Keywords
[object Object]
Internationality of the publisher
Domestic
Language
English
International co-publication
Yes
Co-publication with a company
No
The publication is included in the Ministry of Education and Culture’s Publication data collection
No