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Analysis of Scalable Electromagnetically-Modeled Anomalous Reflectors Through Ray Tracing and Measurements

Year of publication

2025

Authors

Hao, Le; Vuyyuru, Sravan Kumar Reddy; Tretyakov, Sergei A.; Rupp, Markus; Valkonen, Risto

Organizations and authors

Aalto University

Tretyakov Sergei Orcid -palvelun logo

Vuyyuru Sravan Orcid -palvelun logo

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Publisher

IEEE

Volume

6

Issue

5

Pages

1609-1619

​Publication forum

88352

​Publication forum level

1

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Fully open publication channel

Self-archived

Yes

Other information

Fields of science

Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object]

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1109/OJAP.2025.3597865

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes