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Regularity or Anomaly? On The Use of Anomaly Detection for Fine-Grained JIT Defect Prediction

Year of publication

2022

Authors

Lomio, Francesco; Pascarella, Luca; Palomba, Fabio; Lenarduzzi, Valentina;

Organizations and authors

University of Oulu

Lenarduzzi Valentina

Tampere University

Lomio Francesco Orcid -palvelun logo

Publication type

Publication format

Article

Parent publication type

Conference

Article type

Other article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A4 Article in conference proceedings

Publication channel information

Parent publication editors

Callico, Gustavo M.;Hebig, Regina;Wortmann, Andreas;

Publisher

IEEE

Pages

270-273

​Publication forum

71898

​Publication forum level

1

Open access

Open access in the publisher’s service

No

License of the publisher’s version

Other license

Self-archived

Yes

License of the self-archived publication

Muu lisenssi

Other information

Fields of science

Computer and information sciences

Keywords

[object Object],[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

No

DOI

10.1109/SEAA56994.2022.00049

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes