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Contactless analysis of surface passivation and charge transfer at the TiO <sub>2</sub>-Si interface

Year of publication

2024

Authors

Khan, Ramsha; Liu, Xiaolong; Vähänissi, Ville; Ali-Löytty, Harri; Pasanen, Hannu P.; Savin, Hele; Tkachenko, Nikolai V.;

Organizations and authors

Aalto University

Savin Hele Orcid -palvelun logo

Vähänissi Ville Orcid -palvelun logo

Liu Xiaolong Orcid -palvelun logo

Tampere University

Pasanen Hannu P.

Ali-Löytty Harri Orcid -palvelun logo

Khan Ramsha

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Volume

26

Issue

21

Pages

15268-15276

​Publication forum

65018

​Publication forum level

3

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Partially open publication channel

Self-archived

Yes

Other information

Fields of science

Physical sciences; Materials engineering

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1039/D4CP00992D

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes