Mechanisms of Electron-Induced Single Event Latchup

Year of publication

2019

Authors

Tali, Maris; Alía, Rubéen García; Brugger, Markus; Ferlet-Cavrois, Veronique; Corsini, Roberto; Farabolini, Wilfrid; Javanainen, Arto; Santin, Giovanni; Polo, Cesar Boatella; Virtanen, Ari

Organizations and authors

University of Jyväskylä

Virtanen Ari

Javanainen Arto

Tali Maris

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Journal/Series

IEEE Transactions on Nuclear Science

Publisher

Institute of Electrical and Electronics Engineers

Volume

Issue

Pages

437-443

ISSN

0018-9499

Publication forum

57566

Publication forum level

Open access

Open access in the publisher’s service

Self-archived

Yes

Other information

Fields of science

Physical sciences

Keywords

[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

DOI

10.1109/TNS.2018.2884537

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes