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Energy conversion efficiency in betavoltaic cells based on the diamond Schottky diode with a thin drift layer

Year of publication

2020

Authors

Grushko, V.; Beliuskina, O.; Mamalis, A.; Lysakovskiy, V.; Mitskevich, E.; Kiriev, A.; Petrosyan, E.; Chaplynskyi, R.; Bezshyyko, O.; Lysenko, O.

Abstract

The HPHT diamond Schottky diode was assembled as a Metal/Intrinsic/p-doped structure betavoltaic cell (BC) with a very thin (1 μm) drift layer and tested under 5–30 keV electron beam irradiation using a scanning electron microscope (SEM). The effect of the β-radiation energy and the backscattering of electrons on the energy conversion was studied. From the results obtained, it is shown that, the efficiency of the investigated BC increases from 1.01 to 3.75% with the decrease of β-particle energy from 30 to 5 keV due to an increase of the electron beam absorption in a thin drift layer. Maximum efficiency is achieved when the electron beam energy is close to the average β-decay energy of 3H. The BC maximum output power of the 1.6 μW was obtained at an electron beam energy of 15 keV, that matches the β-decay energy of 63Ni. The total BC conversion efficiency at 15 keV electron-beam energy is about 3%. The calculations indicated that a preferable β-source for the diamond based BCs with a thin (1 μm) drift layer is 63Ni.
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Organizations and authors

University of Jyväskylä

Beliuskina Olga

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Volume

157

Article number

109017

​Publication forum

51525

​Publication forum level

1

Open access

Open access in the publisher’s service

No

Self-archived

Yes

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics

Keywords

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Publication country

United Kingdom

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

No

DOI

10.1016/j.apradiso.2019.109017

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes